Title :
Calculation of the net and parasitic capacitances of diffused junctions
fDate :
7/1/1968 12:00:00 AM
Abstract :
Junction capacitance measured at two reverse voltages is sufficient to calculate the parasitic and the net junction capacitances of a transistor or diode. Use of a nomograph further simplifies the calculation.
Keywords :
Capacitance measurement; Diodes; Infrared detectors; Laser beams; Laser radar; Laser theory; Parasitic capacitance; Physics; Temperature; Voltage;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1968.6555
