DocumentCode :
898715
Title :
Measurement and analysis of a microwave oscillator stabilized by a sapphire dielectric ring resonator for ultra-low noise
Author :
Dick, G. John ; Saunders, Jon
Author_Institution :
Frequency Stand. Lab., California Inst. of Technol., Pasadena, CA, USA
Volume :
37
Issue :
5
fYear :
1990
Firstpage :
339
Lastpage :
346
Abstract :
Phase-noise measurements are presented for a microwave oscillator whose frequency is stabilized by a whispering gallery mode sapphire ring resonator with Q of 2*10/sup 5/. The nature of the mode, which involves little metallic conduction, allows nearly full use of the very low dielectric loss in sapphire. Several mode families have been identified with good agreement with calculated frequency predictions. Waveguide coupling parameters have been characterized for the principal (lowest frequency) mode family, for n=5 to n=10 full waves around the perimeter. For a 5-cm wheel resonator in a 7.6-cm container, Q-values of above 10/sup 5/ were found at room temperature for all of the modes in this sequence. Coupling Q-values for the same modes ranged from 10/sup 4/ (n=5) to 10/sup 5/ (n=10) for a WR112 waveguide port at the center of the cylinder wall of the containing can. Phase noise measurements for a transistor oscillator locked to the n=10 (7.84-GHz) mode showed a 1/f/sup 3/ dependence for low offset frequencies, and a value of L(f)=-55 dB/Hz at an offset of 10 Hz from the carrier. The oscillator shows phase noise below the previously reported for any X-band source.<>
Keywords :
dielectric resonators; electron device noise; microwave oscillators; sapphire; 1/f/sup 3/ dependence; 300 K; 5 cm; 7.6 cm; 7.84 GHz; Al/sub 2/O/sub 3/; Q-values; WR112 waveguide port; X-band source; cylinder wall; low dielectric loss; low offset frequencies; microwave oscillator; mode families; phase noise; room temperature; sapphire dielectric ring resonator; transistor oscillator; ultra-low noise; waveguide coupling parameters; wheel resonator; whispering gallery mode; Dielectric losses; Frequency measurement; Microwave measurements; Microwave oscillators; Optical ring resonators; Phase measurement; Phase noise; Q measurement; Ring oscillators; Whispering gallery modes;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/58.105239
Filename :
105239
Link To Document :
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