Title :
Surface-oriented Gunn-effect oscillator
Author :
Foxell, C.A.P. ; Summers, J.G. ; Wilson, K.
Author_Institution :
Associated Semiconductor Manufacturers Ltd., Wembley Laboratories, GEC Hirst Research Centre, Wembley, UK
fDate :
10/1/1965 12:00:00 AM
Abstract :
Coherent Gunn-effect oscillations at 3 Gc/s have been observed between coplanar contacts, with a 30 ¿m separation, on the surface of an epitaxial n-type GaAs wafer. By using this structure the difficulty of preparing thin GaAs wafers necessary for conventional Gunn-effect devices has been avoided; it should be possible to generate frequencies greater than 30 Gc/s using existing photolithographic processes.
Keywords :
Gunn effect; semiconductor devices; semiconductors;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19650197