DocumentCode
899277
Title
An Improved Interferometric Polarization Analyzer for Measuring the Microwave Magneto-Kerr Effect in Semiconductors
Author
Vernon, R.J. ; Dorschner, T.A.
Volume
19
Issue
3
fYear
1971
Firstpage
287
Lastpage
294
Abstract
An interferometric polarization analyzer for measuring the microwave magneto-Kerr effect in semiconductors is described and analyzed, and compared with earlier systems used for the same purpose. The system described utilizes a 4-port waveguide junction referred to as a dual-mode transducer (DMT). This system has important advantages over systems previously used to measure the microwave magneto-Kerr effect. Preliminary data taken with the system are presented and sources of error discussed.
Keywords
Electromagnetic wave polarization; Faraday effect; Magnetic analysis; Magnetic field measurement; Magnetic semiconductors; Microwave measurements; OFDM modulation; Semiconductor waveguides; Transducers; Waveguide junctions;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.1971.1127502
Filename
1127502
Link To Document