An Improved Interferometric Polarization Analyzer for Measuring the Microwave Magneto-Kerr Effect in Semiconductors

An interferometric polarization analyzer for measuring the microwave magneto-Kerr effect in semiconductors is described and analyzed, and compared with earlier systems used for the same purpose. The system described utilizes a 4-port waveguide junction referred to as a dual-mode transducer (DMT). This system has important advantages over systems previously used to measure the microwave magneto-Kerr effect. Preliminary data taken with the system are presented and sources of error discussed.