• DocumentCode
    899412
  • Title

    SB-IGFET: An insulated-gate field-effect transistor using Schottky barrier contacts for source and drain

  • Author

    Lepselter, M.P. ; Sze, Simon M.

  • Volume
    56
  • Issue
    8
  • fYear
    1968
  • Firstpage
    1400
  • Lastpage
    1402
  • Abstract
    Insulated-gate field-effect transistors using Schottky barrier contacts for the source and drain have been studied. At room temperature, the device characteristics are Comparable to conventional IGFET´s with similar electrode geometry. At lower temperatures, the current transport is by tunneling of carriers from the metal across the Schottky barrier to the semiconductor inversion layer.
  • Keywords
    Equations; FETs; Geometry; Insulation; Schottky barriers; Semiconductor device noise; Substrates; Symmetric matrices; Temperature; Voltage;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1968.6618
  • Filename
    1448548