Title : 
SB-IGFET: An insulated-gate field-effect transistor using Schottky barrier contacts for source and drain
         
        
            Author : 
Lepselter, M.P. ; Sze, Simon M.
         
        
        
        
        
        
        
            Abstract : 
Insulated-gate field-effect transistors using Schottky barrier contacts for the source and drain have been studied. At room temperature, the device characteristics are Comparable to conventional IGFET´s with similar electrode geometry. At lower temperatures, the current transport is by tunneling of carriers from the metal across the Schottky barrier to the semiconductor inversion layer.
         
        
            Keywords : 
Equations; FETs; Geometry; Insulation; Schottky barriers; Semiconductor device noise; Substrates; Symmetric matrices; Temperature; Voltage;
         
        
        
            Journal_Title : 
Proceedings of the IEEE
         
        
        
        
        
            DOI : 
10.1109/PROC.1968.6618