DocumentCode
899412
Title
SB-IGFET: An insulated-gate field-effect transistor using Schottky barrier contacts for source and drain
Author
Lepselter, M.P. ; Sze, Simon M.
Volume
56
Issue
8
fYear
1968
Firstpage
1400
Lastpage
1402
Abstract
Insulated-gate field-effect transistors using Schottky barrier contacts for the source and drain have been studied. At room temperature, the device characteristics are Comparable to conventional IGFET´s with similar electrode geometry. At lower temperatures, the current transport is by tunneling of carriers from the metal across the Schottky barrier to the semiconductor inversion layer.
Keywords
Equations; FETs; Geometry; Insulation; Schottky barriers; Semiconductor device noise; Substrates; Symmetric matrices; Temperature; Voltage;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1968.6618
Filename
1448548
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