• DocumentCode
    899497
  • Title

    Tackling variability and reliability challenges

  • Author

    Borkar, Shekhar

  • Author_Institution
    Intel
  • Volume
    23
  • Issue
    6
  • fYear
    2006
  • fDate
    6/1/2006 12:00:00 AM
  • Firstpage
    520
  • Lastpage
    520
  • Abstract
    Variability and reliability will be the barriers to future technology scaling. Every discipline, from fabrication to software, needs to cooperate and make the VLSI system reliable in the presence of variability and the resulting inherent unreliability of components.
  • Keywords
    Testing; VLSI designs; reliability; technology scaling; transistor subthreshold leakage; variability;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2006.156
  • Filename
    4042521
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=899497