DocumentCode :
899673
Title :
Foreword (February 1986)
Volume :
21
Issue :
1
fYear :
1986
Firstpage :
3
Lastpage :
5
Keywords :
CMOS technology; Circuit testing; Design automation; Digital signal processing; Filters; Frequency; Power system reliability; Signal processing; Signal processing algorithms; Very large scale integration;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1986.1052476
Filename :
1052476
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=899673
