DocumentCode
899673
Title
Foreword (February 1986)
Volume
21
Issue
1
fYear
1986
Firstpage
3
Lastpage
5
Keywords
CMOS technology; Circuit testing; Design automation; Digital signal processing; Filters; Frequency; Power system reliability; Signal processing; Signal processing algorithms; Very large scale integration;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1986.1052476
Filename
1052476
Link To Document