• DocumentCode
    899673
  • Title

    Foreword (February 1986)

  • Volume
    21
  • Issue
    1
  • fYear
    1986
  • Firstpage
    3
  • Lastpage
    5
  • Keywords
    CMOS technology; Circuit testing; Design automation; Digital signal processing; Filters; Frequency; Power system reliability; Signal processing; Signal processing algorithms; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1986.1052476
  • Filename
    1052476