Title :
Toroid Corner Chamfering As a Method of Improving the Figure of Merit of Latching Ferrite Phasers (Correspondence)
Author :
Ince, W.J. ; Themme, D.H. ; Willwerth, F.G.
Abstract :
Corner chamfering of latching phaser toroids has been investigated. It is shown that the resulting increase in differential phase shift is a function of the dielectric loading of the toroid slot.
Keywords :
Dielectric constant; Dielectric materials; Dielectric measurements; Ferrites; Garnets; High-K gate dielectrics; Insertion loss; Permittivity measurement; Rectangular waveguides; Thermal resistance;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1971.1127578
