DocumentCode :
900076
Title :
Microwave abstracts
Volume :
19
Issue :
6
fYear :
1971
Firstpage :
567
Lastpage :
568
Keywords :
Abstracts; Dielectric losses; Fluctuations; Frequency measurement; Injection-locked oscillators; Low-frequency noise; Magnetic field measurement; Microwave oscillators; Noise reduction; Semiconductor device noise;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1971.1127580
Filename :
1127580
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=900076
