Title :
Deductive fault simulation for sequential module circuits
Author :
Walczak, Krzysztof
Author_Institution :
Inst. of Comput. Sci., Tech. Univ. of Warsaw, Poland
fDate :
2/1/1988 12:00:00 AM
Abstract :
A cost-effective method is presented for the deductive simulation of fault effects propagating through sequential functional modules that are described by the state-diagram representation of a Moore or Mealy automaton. The cornerstone of the method is a novel definition of the internal fault list of a sequential module. The method can be particularly useful for sequential modules when the state assignment and the gate-level realization are unknown
Keywords :
failure analysis; finite automata; logic testing; sequential circuits; state-space methods; Mealy automaton; Moore automaton; deductive fault simulation; internal fault list; sequential functional modules; state-diagram representation; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer networks; Fault tolerance; Integrated circuit interconnections; Multiprocessing systems; Multiprocessor interconnection networks; Network topology;
Journal_Title :
Computers, IEEE Transactions on
