Title :
CMOS circuit testability
Author :
Moritz, P.S. ; Thorsen, L.M.
fDate :
4/1/1986 12:00:00 AM
Abstract :
CMOS circuits present unique testing problems. Although open faults in CMOS circuits can be statistically tested, a sequence of patterns is required to guarantee a test. In addition, connections in the circuit layout affect testability. An automatic test generator has been developed to generate test sequences which will detect open CMOS faults.
Keywords :
CMOS integrated circuits; Integrated circuit testing; integrated circuit testing; Capacitance; Circuit testing; Degradation; Feedback circuits; Inverters; Output feedback; Propagation delay; Protection; Switches; Switching circuits;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1986.1052520
