Title :
A new method for high-resolution measurement of semiconductor laser linewidth in coherent optical systems
Author :
Gysel, Peter ; Staubli, Roland Karl
Author_Institution :
ETH-Inst. of Commun. Technol., Zurich, Switzerland
Abstract :
A method for the observation of laser linewidth during operation in a coherent optical system is presented. The measurements agree well with the theoretical calculations and show that the power density spectrum of the backscattered intensity from a single-mode fiber corresponds to the laser spectrum with twice the source linewidth, shifted to baseband.<>
Keywords :
backscatter; laser beams; laser variables measurement; light scattering; optical fibres; semiconductor junction lasers; spectral line breadth; backscattered intensity; coherent optical system; high-resolution measurement; power density spectrum; semiconductor laser linewidth; single-mode fiber; Fiber lasers; Laser feedback; Optical feedback; Optical fiber communication; Optical fiber polarization; Optical fiber theory; Optical scattering; Optical sensors; Power lasers; Semiconductor lasers;
Journal_Title :
Photonics Technology Letters, IEEE
