DocumentCode :
900868
Title :
A note on simultaneous isolation of sensor and actuator faults
Author :
Kwan, C. ; Xu, R.
Author_Institution :
Intelligent Autom. Inc., Rockville, MD, USA
Volume :
12
Issue :
1
fYear :
2004
Firstpage :
183
Lastpage :
192
Abstract :
Sensor and actuator self-validation is a critical step in system control and fault diagnostics. If sensors do not work properly, one cannot rely on their outputs to further deduce system status. Similarly, faulty actuators will not satisfy system performance objectives and may cause disasters in feedback control systems. In this paper, a novel method to generate structured residuals for isolating sensor and actuator failures with the least sensitivity to model-plant-mismatch (MPM) and disturbances in multivariate dynamic systems is proposed. The proposed method includes two components. The first component is the generation of the primary residuals directly from noisy input and output measurements without identifying explicitly the model of a system under consideration. The primary residuals are generated such that they have the least sensitivity to any MPM and process disturbances, but have the highest sensitivity to faults in any sensors and/or actuators. The second component of the proposed scheme is the max-min design to transform the primary residuals into a set of structured residuals for fault isolation by improving the existing structured residual approach with maximized sensitivity (SRAMS) . Since one structured residual is made immune to a specified subset of faults, but very sensitive to other faults, any faulty sensors and/or actuators can be isolated by observing the structured residuals in accordance with a predetermined isolation logic. The proposed method has been verified for detection and isolation of faulty sensors and/or actuators in an experimental pilot plant.
Keywords :
actuators; control system synthesis; fault location; feedback; identification; matrix algebra; minimax techniques; noise; sensors; actuator faults; fault diagnostics; fault isolation; feedback control systems; least sensitivity; max-min design; maximized sensitivity; model-plant-mismatch; multivariate dynamic systems; noise; primary residuals; process disturbances; sensor simultaneous isolation; structured residual approach; Actuators; Control systems; Electrical fault detection; Fault detection; Feedback control; Intelligent sensors; Semiconductor process modeling; Sensor systems; Sensor systems and applications; System performance;
fLanguage :
English
Journal_Title :
Control Systems Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-6536
Type :
jour
DOI :
10.1109/TCST.2003.821960
Filename :
1268064
Link To Document :
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