Title :
1-Mbit virtually static RAM
Author :
Nogami, Kazutaka ; Sakurai, Takayasu ; Sawada, Kazuhiro ; Wada, Tetsunori ; Sato, Katsuhiko ; Isobe, Mitsuo ; Kakumu, Masakazu ; Morita, Shigeru ; Yokogawa, Shunji ; Kinugawa, Masaaki ; Asami, Tetsuya ; Hashimoto, Kazuhiko ; Matsunaga, Jun-Ichi ; Nozawa,
fDate :
10/1/1986 12:00:00 AM
Abstract :
The 1-Mb RAM utilizes a one-transistor, one-capacitor dynamic memory cell. Since all the refresh-related operations are done on chip, the RAM acts as a virtually static RAM (VSRAM). The refresh operations are merged into the normal operation, called a background refresh, the main feature of the VSRAM. Since the fast operation of the core part of the RAM is crucial to minimize the access-time overhead by the background refresh, 16 divided bit lines and parallel processing techniques are utilized. Novel hot-carrier resistant circuits are applied selectively to bootstrapped nodes for high hot-carrier reliability. N-channel memory cells are embedded in a p-well, which gives a low soft error rate of less than 10 FIT. 1-μm NMOSFETs with moderately lightly doped drain structures offer fast 5-V operation with sufficient reliability. An advanced double-level poly-Si and double-level Al twin-well CMOS technology is developed for fast circuit speed and high packing density. The memory cell size is 3.5×8.4 μm/SUP 2/, and the chip size is 5.99×13.8 mm./SUP 2/. Address access time is typically 62 ns, with 21-mA operating current and 30-μA standby current at room temperature.
Keywords :
Field effect integrated circuits; Integrated memory circuits; Random-access storage; field effect integrated circuits; integrated memory circuits; random-access storage; CMOS technology; Circuits; Costs; Error analysis; Hot carriers; Intelligent control; Lithography; Parallel processing; Random access memory; Read-write memory;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1986.1052592