DocumentCode :
901159
Title :
Physical modeling of GaAs MESFETs in an integrated CAD environment: from device technology to microwave circuit performance
Author :
Ghione, Givanni ; Naldi, Carlo U. ; Filicori, Fabio
Author_Institution :
Dept. of Electron., Polytech. of Milan, Italy
Volume :
37
Issue :
3
fYear :
1989
fDate :
3/1/1989 12:00:00 AM
Firstpage :
457
Lastpage :
468
Abstract :
The linkage between a physical device simulator for small- and large-signal characterization and CAD (computer-aided design) tools for both linear and nonlinear circuit analysis and design is considered. Efficient techniques for the physical DC and small-signal analysis of MESFETs are presented. The problem of physical simulation in a circuit environment is discussed, and it is shown how such a simulation makes possible small-signal models accounting for propagation and external parasitics. Efficient solutions for physical large-signal simulation, based on deriving large-signal equivalent circuits from small-signal analyses under different bias conditions, are proposed. The small- and large-signal characterizations allow physical simulation to be performed efficiently in a circuit environment. Examples and results are presented
Keywords :
III-V semiconductors; Schottky gate field effect transistors; circuit CAD; semiconductor device models; solid-state microwave circuits; GaAs; MESFETs; bias conditions; circuit analysis; device technology; equivalent circuits; external parasitics; integrated CAD environment; large-signal characterization; microwave circuit performance; physical device simulator; small-signal analysis; Analytical models; Circuit analysis; Circuit simulation; Computational modeling; Computer simulation; Couplings; Design automation; Gallium arsenide; MESFETs; Nonlinear circuits;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.21615
Filename :
21615
Link To Document :
بازگشت