Title :
Measurements of multiplication effects on noise in silicon avalanche diodes
Author :
Lee, Craig A. ; Dalman, G.C.
Abstract :
Fine grain measurements of avalanche multiplication and noise in large area uniform silicon avalanche diodes are discussed. A high resolution apparatus is described which is capable of resolving multiplication noise in regions separated by only 10-4inches (∼2.5 microns) and recording this noise as a function of position over the entire diode area.
Keywords :
Charge carrier processes; Current density; Diodes; Laser beams; Light sources; Microscopy; Noise generators; Noise measurement; Phase measurement; Silicon;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1968.6783
