Title :
Stable extraction of linearity (VIP3) for nanoscale RF CMOS devices
Author :
Choi, Woo Young ; Choi, Byung Yong ; Woo, Dong-Soo ; Lee, Jong Duk ; Park, Byung-Gook
Author_Institution :
Inter-Univ. Semicond. Res. Center, Seoul, South Korea
Abstract :
We have proposed an improved and stable algorithm for linearity (VIP3) extraction by setting an optimized measurement node interval. This algorithm, considering the accuracy of measurement appliances, provides less noisy VIP3 without loss of details. Adopting it, VIP3 can be derived satisfying 1% error criterion. Accurate VIP3 extraction can be a strong help in CMOS performance analysis for the RF applications. Measurements were carried out on a nMOSFET.
Keywords :
CMOS integrated circuits; nanoelectronics; radiofrequency integrated circuits; CMOS performance analysis; RF applications; integrated circuits; linearity extraction algorithm; nanoscale RF CMOS devices; optimized measurement node interval; Capacitance measurement; Data mining; Distortion measurement; Home appliances; Linearity; Loss measurement; Nanoscale devices; Noise measurement; Radio frequency; Semiconductor device noise;
Journal_Title :
Microwave and Wireless Components Letters, IEEE
DOI :
10.1109/LMWC.2003.818527
