DocumentCode :
901343
Title :
Application of Deschamps´ Graphical Method to Measurements of the Scattering Coefficients of Multiport Waveguide Junctions
Author :
Chang, C.T.M.
Volume :
20
Issue :
2
fYear :
1972
fDate :
2/1/1972 12:00:00 AM
Firstpage :
186
Lastpage :
187
Abstract :
A method for measuring scattering coefficients of a multiport waveguide junction is presented. It is based on the application of Deschamps´ graphical technique to reduced multiport junctions, and analysis of measurements done with either matched or nearly matched loads terminated at all but the input and output ports. Averaging and least-square fitting are introduced to reduce errors from measurements.
Keywords :
Atomic measurements; Diodes; Equations; Frequency; Oscillators; Reflection; Scattering; Silicon; UHF measurements; Waveguide junctions;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1972.1127709
Filename :
1127709
Link To Document :
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