DocumentCode :
901460
Title :
Pinch-off voltage shifts in MOSFET´s at helium temperatures
Author :
Bostian, C.W.
Volume :
56
Issue :
11
fYear :
1968
Firstpage :
2085
Lastpage :
2085
Abstract :
The pinch-off voltage of several commercial silicon MOSFET types was measured at room temperature and at 4.2°K. Typically, room temperature and 4.2°K values differed in magnitude by approximately one volt.
Keywords :
Boundary conditions; FETs; Helium; Intrusion detection; MOSFET circuits; Message-oriented middleware; Silicon; Temperature measurement; Temperature sensors; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1968.6807
Filename :
1448737
Link To Document :
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