Modal characteristics of graded multilayer optical waveguides

Author

Thompson, Cameron ; Weiss, Bernard L.

Author_Institution

Dept. of Electron. & Electr. Eng., Surrey Univ., Guildford, UK

Volume

14

Issue

5

fYear

1996

fDate

5/1/1996 12:00:00 AM

Firstpage

894

Lastpage

900

Abstract

The modal characteristics of graded-step index multilayer planar waveguides for layer thicknesses down to those applicable for quantum well structures have been investigated here. The effects of linear grading of the transverse stepped refractive index profile have been evaluated in terms of the mode field profiles and the modal spectrum. The position of the maximum of the fundamental mode field profile can be moved toward the upper waveguide cladding/core interface with consequential increase in the evanescent field magnitudes

Keywords

claddings; gradient index optics; optical planar waveguides; optical waveguide theory; refractive index; evanescent field magnitudes; fundamental mode field profile maximium; graded-step index multilayer planar waveguides; layer thicknesses; linear grading; modal characteristics; modal spectrum; mode field profiles; quantum well structures; transverse stepped refractive index profile; upper waveguide cladding/core interface; Nonhomogeneous media; Nonlinear optics; Optical planar waveguides; Optical refraction; Optical surface waves; Optical variables control; Optical waveguides; Quantum well devices; Refractive index; Semiconductor waveguides;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.495174

Filename

495174