Radiation-Induced Charge Dynamics in Dielectrics

A general physical model is presented for the analysis of charge dynamics in dielectrics exposed to ionizing radiation. Discrete trap levels, recombination between trapped and free carriers, trapping and detrapping events, and the mobility of positive and negative charge carriers are included in the theory. This model is applied to electron beam irradiated Teflon FEP foils and results for various boundary conditions are compared with experimental data from a split Faraday cup arrangement.