• DocumentCode
    901590
  • Title

    Phase Space Gaussian Beam Summation Analysis of Half Plane Diffraction

  • Author

    Katsav, Michael ; Heyman, Ehud

  • Author_Institution
    Tel Aviv Univ., Tel Aviv
  • Volume
    55
  • Issue
    6
  • fYear
    2007
  • fDate
    6/1/2007 12:00:00 AM
  • Firstpage
    1535
  • Lastpage
    1545
  • Abstract
    The canonical problem of scattering of an ultrawideband (UWB) plan wave by a perfectly conducting half plane is analyzed via the UWB frame-based Gaussian beam summation (GBS) formulation of . The scattered field is described as a sum of isodiffracting-Gaussian beams (ID-GB) that emerge from the edge in a discrete frequency-independent lattice of directions, plus beams that describe the geometrical optics reflections. Asymptotic expressions for the diffracted beams excitation amplitudes are derived, interpreted, and validated via a comparison with an exact numerical calculations. The beams that are strongly excited are those associated with the geometrical optics and the edge diffracted rays. As discussed in the conclusions to this paper, the quality of the present GBS scheme deteriorates for grazing incidence and/or observations, hence we propose an alternative GBS scheme that is expected to be more useful for edge diffraction problems. This issue will be presented in a future publication.
  • Keywords
    Gaussian processes; electromagnetic wave diffraction; electromagnetic wave scattering; edge diffraction; frequency-independent lattice of directions; geometrical optics reflections; half plane diffraction; isodiffracting-Gaussian beams; perfectly conducting half plane; phase space Gaussian beam summation analysis; ultrawideband plan wave; Collimators; Frequency domain analysis; Geometrical optics; Helium; Lattices; Optical diffraction; Optical reflection; Optical scattering; Stochastic processes; Ultra wideband technology; Beam summation representations; edge-diffraction; phase space;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/TAP.2007.897134
  • Filename
    4232638