• DocumentCode
    901686
  • Title

    Total Dose Response of STL and I2L Logic Devices

  • Author

    Poblenz, F.W. ; Carroll, R.G. ; Whitmire, D.A. ; Cheney, B.W. ; Walthall, D.L.

  • Author_Institution
    Texas Instruments Incorporated, P.O. Box 226015, Dallas, Texas 75266
  • Volume
    29
  • Issue
    6
  • fYear
    1982
  • Firstpage
    1727
  • Lastpage
    1732
  • Abstract
    Total dose effects on nine STL and I2L LSI commercial circuits are discussed. The devices were developed to perform Global Positioning System (GPS) functions. The I2L devices showed some radiation sensitivity in output load voltage (VOL) at high output load currents but were functional at lower output currents to the maximum test level of 1 × 106 rad (Si). STL devices were relatively unaffected by the radiation. A diagnostic use of total dose testing is discussed. The test results of a hardened redesign of one of the circuits are shown.
  • Keywords
    Circuit testing; Global Positioning System; Instruments; Integrated circuit interconnections; Large scale integration; Logic circuits; Logic devices; Radiation hardening; Resistors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1982.4336437
  • Filename
    4336437
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=901686