Title :
Total Dose Response of STL and I2L Logic Devices
Author :
Poblenz, F.W. ; Carroll, R.G. ; Whitmire, D.A. ; Cheney, B.W. ; Walthall, D.L.
Author_Institution :
Texas Instruments Incorporated, P.O. Box 226015, Dallas, Texas 75266
Abstract :
Total dose effects on nine STL and I2L LSI commercial circuits are discussed. The devices were developed to perform Global Positioning System (GPS) functions. The I2L devices showed some radiation sensitivity in output load voltage (VOL) at high output load currents but were functional at lower output currents to the maximum test level of 1 × 106 rad (Si). STL devices were relatively unaffected by the radiation. A diagnostic use of total dose testing is discussed. The test results of a hardened redesign of one of the circuits are shown.
Keywords :
Circuit testing; Global Positioning System; Instruments; Integrated circuit interconnections; Large scale integration; Logic circuits; Logic devices; Radiation hardening; Resistors; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1982.4336437
