• DocumentCode
    901726
  • Title

    Analysis of Time-Dependent Radiation-Induced Conductivity in Dielectrics and Effect on Cable SGEMP

  • Author

    Shaeffer, D.Lynn ; Siegel, Joel M.

  • Author_Institution
    The BDM Corporation 1801 Randolph Road S.E. Albuquerque, NM 87106
  • Volume
    29
  • Issue
    6
  • fYear
    1982
  • Firstpage
    1745
  • Lastpage
    1753
  • Abstract
    Analytic and numerical solutions are presented for a simple time-dependent solid-state band model of radiation-induced conductivity in polyethelene and Teflon. The analytic solution is found to provide insight to physical processes dominant in various intervals of time throughout the radiation pulse. The numerical solution provides a representation for the dose-dependent proportionality factor F(¿), proposed by van Lint et al, used to calculate prompt conductivity from ¿p = F(¿)¿. At high doses, F(¿) is an order of magnitude smaller than at low doses. This decrease of F(¿) is due to bimolecular recombination, an effect apparently not previously reported experimentally. The reduction in F(¿) at high doses is shown to enhance the short circuit current for a cable SGEMP model of residual gaps by a factor of three. In addition, the dose-dependent behavior of F(¿) can significantly alter the shape and time of occurrence of the peak of the waveform of this short circuit current compared to corresponding results for a dose-independent factor.
  • Keywords
    Cable insulation; Charge carrier processes; Conductivity; Dielectrics and electrical insulation; Ionizing radiation; Plastic insulation; Polymers; Short circuit currents; Solid modeling; Solid state circuits;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1982.4336441
  • Filename
    4336441