Ionization-Induced Breakdown and Conductivity of Satellite Dielectrics

Previous satellite SGEMP (System Generated Electromagnetic Pulse) experiments have indicated that charged dielectric materials may break down when exposed to intense pulses of ionizing radiation (Ref. 1). This paper reports the results of an experiment conducted to explore that possibility. The field was applied from a high voltage power supply to aluminum electrodes. The material was then irradiated, with the voltage being monitored as a function of time. Discharges were observed within a range of doses. Ionization-induced conductivity was found to be linear with dose, and an increasing function of field.