Title :
An 86 K component bipolar VLSI masterslice with a 290-ps loaded gate delay
Author :
Suzuki, Masao ; Hirata, Michihiro ; Ito, Yoshitaka
fDate :
2/1/1987 12:00:00 AM
Abstract :
A very large-scale integrated (VLSI) bipolar masterslice has been demonstrated. This masterslice has a loaded three-input ECL gate delay of 290 ps and an unloaded gate delay of 164 ps at a power dissipation of 1.5 mW/gate. It is fabricated by using 1.5-μm rule super self-aligned process technology (SST), 2-μm-wide deep U-groove isolation, and a fine 5-μm pitch three-level metallization process. The authors describe its process features, cell design, chip structure, experimental results, and applications.
Keywords :
Bipolar integrated circuits; Cellular arrays; Emitter-coupled logic; Integrated logic circuits; VLSI; bipolar integrated circuits; cellular arrays; emitter-coupled logic; integrated logic circuits; Delay; Fabrication; Indium tin oxide; Isolation technology; Large scale integration; Master-slave; Parasitic capacitance; Power dissipation; Resistors; Very large scale integration;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1987.1052669