DocumentCode
901782
Title
The Limits to Hardening Electronic Boxes to IEMP Coupling
Author
Seidler, W. ; Keyser, R. ; Walters, D. ; Harper, H.
Author_Institution
JAYCOR, 11011 Torreyana Road, San Diego, California 92121
Volume
29
Issue
6
fYear
1982
Firstpage
1780
Lastpage
1786
Abstract
Experimental investigations of the IEMP coupling processes within electronics enclosures have determined that there are practical limits to the effectiveness of IEMP hardening approaches. The use of low-electron-emission coatings or potting compounds and ground planes reduces the IEMP coupling to those processes which occur within the circuit boards themselves. Depending on the thickness of the circuit board, the IEMP coupling may be dominated by the bulk photocurrents emitted within the dielectric or the dipole layer formed over the metallic conductors. Results of this study indicate that IEMP also has a low-impedance coupling mechanism governed by secondary electrons which may be collected by circuit potentials as low as +5 volts.
Keywords
Cable shielding; Coatings; Coupling circuits; Current density; Dielectrics; Electrons; Electrostatics; Nuclear power generation; Printed circuits; Protection;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1982.4336447
Filename
4336447
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