• DocumentCode
    901782
  • Title

    The Limits to Hardening Electronic Boxes to IEMP Coupling

  • Author

    Seidler, W. ; Keyser, R. ; Walters, D. ; Harper, H.

  • Author_Institution
    JAYCOR, 11011 Torreyana Road, San Diego, California 92121
  • Volume
    29
  • Issue
    6
  • fYear
    1982
  • Firstpage
    1780
  • Lastpage
    1786
  • Abstract
    Experimental investigations of the IEMP coupling processes within electronics enclosures have determined that there are practical limits to the effectiveness of IEMP hardening approaches. The use of low-electron-emission coatings or potting compounds and ground planes reduces the IEMP coupling to those processes which occur within the circuit boards themselves. Depending on the thickness of the circuit board, the IEMP coupling may be dominated by the bulk photocurrents emitted within the dielectric or the dipole layer formed over the metallic conductors. Results of this study indicate that IEMP also has a low-impedance coupling mechanism governed by secondary electrons which may be collected by circuit potentials as low as +5 volts.
  • Keywords
    Cable shielding; Coatings; Coupling circuits; Current density; Dielectrics; Electrons; Electrostatics; Nuclear power generation; Printed circuits; Protection;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1982.4336447
  • Filename
    4336447