Title :
Opens tests for CMOS
Abstract :
The author proposes that modulation of CMOS supply voltage provides a single vector test for opens which is free of problems from glitches and races.
Keywords :
CMOS integrated circuits; Integrated circuit testing; integrated circuit testing; Broadband amplifiers; Capacitance; Circuit testing; Impedance; Microcomputers; Microprocessors; Physics; Switching circuits; Voltage; Wideband;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1987.1052688
