Title :
The Damage Equivalence of Electrons, Protons, and Gamma Rays in MOS Devices
Author :
Brucker, G.J. ; Stassinopoulos, E.G. ; Gunten, O. Van ; August, L.S. ; Jordan, T.M.
Author_Institution :
RCA David Sarnoff Research Center, Princeton, NJ
Keywords :
Dosimetry; Electrons; Gamma rays; Inverters; Laboratories; Large scale integration; MOS devices; Protons; Testing; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1982.4336479
