DocumentCode
902290
Title
A 16-level/cell dynamic memory
Author
Aoki, Masakazu ; Nakagome, Yoshinobu ; Horiguchi, Masahi ; Ikenaga, Shin Ichi ; Shimohigashi, Katsuhiro
Volume
22
Issue
2
fYear
1987
fDate
4/1/1987 12:00:00 AM
Firstpage
297
Lastpage
299
Abstract
A multilevel storage dynamic memory using a standard DRAM memory cell array is presented. A staircase word pulse and a charge-transfer preamplifier are used for converting binary data to multilevel storage voltages and vice versa. The 16-level (4-bit)/cell READ/WRITE operation has been confirmed at storage levels as low as 80-100 mV. The storage-level voltage accuracy is limited basically by subthreshold leakage current.
Keywords
Integrated memory circuits; Random-access storage; integrated memory circuits; random-access storage; Capacitance; Large scale integration; MOS devices; Multilevel systems; Preamplifiers; Random access memory; Solid state circuits; Subthreshold current; Threshold voltage; Timing;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1987.1052717
Filename
1052717
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