Title :
The Dependence of Single Event Upset on Proton Energy (15-590 MeV)
Author :
Nichols, D.K. ; Price, W.E. ; Andrews, J.L.
Author_Institution :
The Jet Propulsion Laboratory Pasadena, California
Keywords :
Circuit testing; Cyclotrons; Particle beams; Power supplies; Printed circuits; Protons; Read-write memory; Single event upset; System testing; Teleprinting;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1982.4336500
