DocumentCode

902346

Title

The Dependence of Single Event Upset on Proton Energy (15-590 MeV)

Author

Nichols, D.K. ; Price, W.E. ; Andrews, J.L.

Author_Institution

The Jet Propulsion Laboratory Pasadena, California

Volume

29

Issue

6

fYear

1982

Firstpage

2081

Lastpage

2084

Keywords

Circuit testing; Cyclotrons; Particle beams; Power supplies; Printed circuits; Protons; Read-write memory; Single event upset; System testing; Teleprinting;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.1982.4336500

Filename

4336500