Title :
On-Chip Measurement of Jitter Transfer and Supply Sensitivity of PLL/DLLs
Author_Institution :
Stanford Univ., Stanford, CA
fDate :
6/1/2009 12:00:00 AM
Abstract :
This brief describes low-cost on-chip measurement circuits for jitter transfer and supply sensitivity of phase-locked loops (PLLs) and delay-locked loops (DLLs). Unlike previous works that measured the frequency-domain responses, the proposed circuits measure the time-domain responses of the PLL/DLL to the periodic disturbances applied to either its input clock phase or its supply voltage. A synchronous sampling technique accurately measures the PLL/DLL´s periodic response while suppressing the unrelated noises and interferences via averaging. The synchronous sampler outputs either DC voltage or digital values, making it suitable for low-cost characterization and production tests. The procedure for estimating the frequency-domain transfer functions from the measured time-domain responses is outlined. The jitter transfer and supply sensitivity measurements were demonstrated with a PLL fabricated in 0.13-mum CMOS. Compared with the PLL that occupied 1.1x0.46 mm2 and dissipated 36 mW from a 1.2-V supply, the on-chip measurement circuits occupied only 0.014 mm2 and dissipated only 2.6 mW.
Keywords :
CMOS digital integrated circuits; delay lock loops; digital phase locked loops; frequency-domain analysis; integrated circuit measurement; interference suppression; jitter; time-domain analysis; transfer functions; CMOS; DC voltage; PLL fabrication; delay-locked loop; digital value output; frequency-domain response measurement; frequency-domain transfer function; input clock phase; interference suppression; jitter transfer; on-chip measurement; phase-locked loop; power 2.6 mW; power 36 mW; size 0.13 mum; supply sensitivity measurement; synchronous sampler; synchronous sampling technique; time-domain response measurement; unrelated noise suppression; voltage 1.2 V; CMOS; jitter transfer function; on-chip measurement; phase-locked loop (PLL); supply sensitivity;
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2009.2020941