Title :
A four-state EEPROM using floating-gate memory cells
Author :
Bleiker, Christoph ; Melchior, Hans
fDate :
6/1/1987 12:00:00 AM
Abstract :
An electrically erasable programmable read-only memory (EEPROM) is used in a novel way as a four-state memory by charging the floating gate to determined values. The memory cell and the complete programming and readout circuit are described. Retention characteristics are investigated and found to confirm a thermionic emission model. Retention time is estimated to be more than 22 years at 125°C. Secondary effects like charge trapping in the oxide are successfully suppressed by a controlled writing procedure. Using such a four-state EEPROM instead of a binary cell, a reduction in chip area of 40% can be expected for a 1-kb memory.
Keywords :
Integrated memory circuits; PROM; integrated memory circuits; Circuits; EPROM; Helium; Hot carrier injection; Logic; Nonvolatile memory; PROM; Thermionic emission; Voltage; Writing;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1987.1052751