DocumentCode
902671
Title
Barrier-height determinations in thin-film tunnel junctions
Author
Tosser, A. ; Cormier, J.C. ; Thureau, P.
Author_Institution
Université de Caen, Laboratoire de Physique Experimentale, Caen, France
Volume
2
Issue
8
fYear
1966
fDate
8/1/1966 12:00:00 AM
Firstpage
304
Lastpage
305
Abstract
Using the previously determined value of the internal electric field of tunnel diodes, the authors use the electric tunnel method for the evaluation of metal¿dielectric barrier heights. Effective mass of electron and dielectric permittivity are constant for a range of thickness from 50 to 150 Ã
.
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19660257
Filename
4233189
Link To Document