• DocumentCode
    902671
  • Title

    Barrier-height determinations in thin-film tunnel junctions

  • Author

    Tosser, A. ; Cormier, J.C. ; Thureau, P.

  • Author_Institution
    Université de Caen, Laboratoire de Physique Experimentale, Caen, France
  • Volume
    2
  • Issue
    8
  • fYear
    1966
  • fDate
    8/1/1966 12:00:00 AM
  • Firstpage
    304
  • Lastpage
    305
  • Abstract
    Using the previously determined value of the internal electric field of tunnel diodes, the authors use the electric tunnel method for the evaluation of metal¿dielectric barrier heights. Effective mass of electron and dielectric permittivity are constant for a range of thickness from 50 to 150 Å.
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19660257
  • Filename
    4233189