Comment on ´Complete characterisation of laser diode thermal circuit by voltage transient measurements´ (and reply)

For the original article see ibid., vol.29, p.318-20 (1993). The commenter states that the authors have reported interesting results on the estimation of different contributions to the total thermal resistance of laser diodes. However, this network approach is said to suffer, from certain inherent methodical difficulties. The commenter feels that these should be overcome, before this simple and valuable method can serve as a reliable tool for device testing and characterisation aims. In reply Piccirillo and Bagnoli clarify some of the points raised and state the contribution of the Joulean losses in their experiment.