DocumentCode :
902873
Title :
RF CMOS low-phase-noise LC oscillator through memory reduction tail transistor
Author :
Boon, C.C. ; Do, M.A. ; Yeo, K.S. ; Ma, J.G. ; Zhang, X.L.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
Volume :
51
Issue :
2
fYear :
2004
fDate :
2/1/2004 12:00:00 AM
Firstpage :
85
Lastpage :
90
Abstract :
Based on the understanding of flicker noise generation in "silicon metal-oxide semiconductor field-effect transistors" (MOSFETs), a novel method for improving the phase noise performance of a CMOS LC oscillator is presented. Zhou et al. and Hoogee have suggested that the 1/f noise can be reduced through a switched gate, and the flicker noise generated is inversely proportional to the gate switching frequency. The novel tail transistor topology is compared to the two popular tail transistor topologies, namely, the fixed biasing tail transistor and without tail transistor. Through this technique, a figure of merit of 193 dB is achieved using a fully integrated CMOS oscillator with a tank quality factor of about 9.
Keywords :
CMOS integrated circuits; MOSFET; field effect transistors; network topology; oscillators; 1-f noise; CMOS LC oscillator; CMOS oscillator; RF CMOS low-phase-noise LC oscillator; fixed biasing tail transistor; flicker noise; gate switching frequency; memory reduction tail transistor; phase noise performance; silicon metal-oxide semiconductor field-effect transistors; switched gate; tail transistor topology; tank quality factor; 1f noise; FETs; MOS devices; MOSFETs; Oscillators; Phase noise; Radio frequency; Silicon; Tail; Topology;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2003.821519
Filename :
1268240
Link To Document :
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