Title :
Concurrent error detection in highly structured logic arrays
Author :
Fuchs, W. Kent ; Chen, Chien-Yi Roger ; Abraham, Jacob A.
fDate :
8/1/1987 12:00:00 AM
Abstract :
Two strategies for encoding the inputs and outputs of highly structured logic arrays (HSLAs) are introduced. The two schemes are particularly relevant for concurrent error detection of both permanent and nonpermanent errors in programmable logic arrays (PLAs) and read-only memories (ROMs). The first method of concurrent error detection (CED) is based on a comprehensive fault model and relies on detection of unidirection errors. The second approach relies on a detailed examined of decoder layouts resulting in fault avoidance through layout rules, which avoid failures causing unidirectional errors. Efficient parity techniques are shown to provide a low-overhead solution to concurrent error detection when coupled with appropriate fault-avoidance techniques.
Keywords :
Cellular arrays; Encoding; Error detection; Integrated logic circuits; Integrated memory circuits; Read-only storage; cellular arrays; encoding; error detection; integrated logic circuits; integrated memory circuits; read-only storage; Circuit faults; Decoding; Encoding; Fault detection; Logic arrays; Logic devices; Programmable logic arrays; Read only memory; Testing; Very large scale integration;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1987.1052776