Title :
Improvement of reliability of Gunn diodes
Author :
Shoji, Mamoru ; D´Alessio, F.J.
Abstract :
The reliability of Gunn diodes is greatly improved by using device structures which prevent high-field domains from reaching the anode.
Keywords :
Active circuits; Anodes; Character generation; Delay effects; Diodes; Frequency; Gunn devices; Gyrators; Q factor; Voltage;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1969.6950
