DocumentCode :
903130
Title :
Foreword (October 1987)
Volume :
22
Issue :
5
fYear :
1987
Firstpage :
640
Lastpage :
642
Keywords :
BiCMOS integrated circuits; CMOS logic circuits; CMOS technology; Circuit testing; EPROM; Gallium arsenide; Lithography; Power dissipation; Random access memory; Very large scale integration;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1987.1052793
Filename :
1052793
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=903130
