Title :
A 65-ns 4-Mbit CMOS DRAM with a twisted driveline sense amplifier
Author :
Kimura, Katsutaka ; Shimohigashi, Katsuhiro ; Etoh, Jun ; Ishihara, Masamichi ; Miyazawa, Kazuyuki ; Shimizu, Shinji ; Sakai, Yoshio ; Yagi, Kunihiro
fDate :
10/1/1987 12:00:00 AM
Abstract :
A 4-Mb word×1-b/1-Mb word×4-b CMOS DRAM characterized by a twisted driveline sense-amplifier (TDSA) scheme and a multiphase drive circuit which enable faster access time and a smaller peak power supply current, respectively, is described. The implementation of an initialize mode with CAS-before-RAS (CBR) logic control, which reduces the memory-chip initialization time by almost a thousand times, is also discussed. The chip measures 6.38×17.38 mm/SUP 2/ and has been fabricated by using double-well CMOS technology with a minimum design rule of 0.8 μm. A typical access time of 65 ns and a peak power supply current of less then 150 mA have been obtained.
Keywords :
CMOS integrated circuits; Integrated memory circuits; Random-access storage; integrated memory circuits; random-access storage; CMOS logic circuits; CMOS technology; Chip scale packaging; Circuit noise; Current supplies; Parasitic capacitance; Power supplies; Random access memory; Semiconductor device measurement; Yagi-Uda antennas;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1987.1052795