DocumentCode :
903182
Title :
A 4-Mbit CMOS EPROM
Author :
Ohtsuka, Nobuaki ; Tanaka, Sumio ; Miyamoto, Jun-ichi ; Saito, Shinji ; Atsumi, Shigeru ; Imamiya, Ken-ichi ; Yoshikawa, Kuniyoshi ; Matsukawa, Naohiro ; Mori, Seiichi ; Arai, Norihisa ; Shinagawa, Takeshi ; Kaneko, Yukio ; Matsunaga, Jun-Ichi ; Iizuka, T
Volume :
22
Issue :
5
fYear :
1987
fDate :
10/1/1987 12:00:00 AM
Firstpage :
669
Lastpage :
675
Abstract :
A high-density (512K-word×8-b) erasable programmable read-only memory (EPROM) has been designed and fabricated by using 0.8-μm n-well CMOS technology. A novel chip layout and a sense-amplifier circuit produce a 120-ns access time and a 4-mA operational supply current. The interpoly dielectric, composed of a triple-layer structure, realizes a 10-μs/byte fast programming time, in spite of scaling the programming voltage V/SUB PP/ from 12.5 V for a 1-Mb EPROM to 10.5 V for this 4-Mb EPROM. To meet the increasing demand for a one-time programmable (OTP) ROM, a circuit is implemented to monitor the access time after the assembly. A novel redundancy scheme is incorporated to reduce additional tests after the laser fuse programming. Cell size and chip size are 3.1×2.9 μm/SUP 2/ and 5.86×14.92 mm/SUP 2/, respectively.
Keywords :
CMOS integrated circuits; Integrated memory circuits; PROM; Redundancy; integrated memory circuits; redundancy; Assembly; CMOS technology; Circuits; Current supplies; Dielectrics; EPROM; Monitoring; PROM; Read only memory; Voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1987.1052798
Filename :
1052798
Link To Document :
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