Title :
Design Solutions for Sample-and-Hold Circuits in CMOS Nanometer Technologies
Author :
Centurelli, Francesco ; Monsurrò, Pietro ; Pennisi, Salvatore ; Scotti, Giuseppe ; Trifiletti, Alessandro
Author_Institution :
Dipt. di Ing. Elettron., Univ. di Roma La Sapienza, Rome
fDate :
6/1/2009 12:00:00 AM
Abstract :
Solutions for the design of low-voltage sample-and-hold (S/H) circuits in CMOS nanometer technologies are presented. As a design example, a 0.8-V supply S/H is designed and simulated using a 130-nm CMOS process. It dissipates 0.5 mW at dc and provides almost a rail-to-rail signal swing. When clocked at 40 MS/s and with a 1.4- VPP differential input signal, the simulated spurious-free dynamic range, signal-to-noise ratio, and total harmonic distortion are 57, 67, and -56 dB (9 equivalent bits), respectively, with low sensitivity to supply, temperature, process, and mismatch variations. The proposed solution employs a three-stage low-voltage amplifier without a tail current source in the differential pair and a switch topology, which combines clock voltage doubling and dummy switches.
Keywords :
CMOS analogue integrated circuits; harmonic distortion; low-power electronics; nanoelectronics; operational amplifiers; sample and hold circuits; CMOS nanometer technology; clock voltage doubling; low-voltage sample-and-hold circuit; power 0.5 mW; rail-to-rail signal swing; signal-to-noise ratio; simulated spurious-free dynamic range; size 130 nm; three-stage low-voltage amplifier; total harmonic distortion; voltage 0.8 V; Bootstrapped switch; nested Miller compensation; sample-and-hold (S/H); very low voltage circuits;
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2009.2020945