Title :
Novel circuit technology for ECL-compatible GaAs static RAMs with small access time scattering
Author :
Hayashi, Takehisa ; Tanaka, Hirotoshi ; Yamashita, Hiroki ; Masuda, Noboru ; Doi, Toshio ; Masaki, Akira ; Hashimoto, Norikazu
fDate :
10/1/1987 12:00:00 AM
Abstract :
A novel circuit technology has been developed to realize GaAs SRAMs suitable for use in real-system environments. It has achieved Si ECL compatibility through the use of an ECL 100 K-compatible input buffer circuit with on-chip reference compensation. Wide V/SUB th/ tolerance and an improved noise margin have been obtained through the use of a novel normally-on-type circuit called the FET logic with Schottky diode and coupling capacitor (FLSC). Two experimental ECL-compatible GaAs SRAMs (256-word×4-b and 1024-word×4-b) were designed and successfully fabricated using this technology. In the 4 K SRAM, an access time of 2.2-3.0 ns with a power dissipation of 890 mW was achieved and the normal read/write operation at 4-ns cycle time was also confirmed.
Keywords :
Emitter-coupled logic; Field effect integrated circuits; Gallium arsenide; III-V semiconductors; Integrated memory circuits; Random-access storage; emitter-coupled logic; field effect integrated circuits; gallium arsenide; integrated memory circuits; random-access storage; Capacitors; Circuit noise; Coupling circuits; FETs; Gallium arsenide; Logic circuits; Random access memory; Scattering; Schottky diodes; Working environment noise;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1987.1052824