DocumentCode :
903711
Title :
Derating of semiconductor fuselinks for use in high-frequency applications
Author :
Howe, A.F. ; Jordan, C.M.
Author_Institution :
University of Nottingham, Department of Electrical and Electonic Engineering, Nottingham, UK
Volume :
129
Issue :
3
fYear :
1982
fDate :
5/1/1982 12:00:00 AM
Firstpage :
111
Lastpage :
116
Abstract :
High-breaking-capacity fuselinks used in high-frequency power inverter (50 kHz) circuits sometimes operate spuriously below rated current. Premature melting is more common when the fuselinks are mounted near associated cables or semiconductors. This unexpected operation can be attributed to skin and proximity effects, which are consequences of the electromagnetic induction between parallel current-carrying conductors. To prevent undue action of the fuselinks, their ratings must be reduced in accordance with a function of frequency, fuse dimensions and the distance between the fuselink and current-carrying conductors.
Keywords :
electric fuses; electromagnetic induction; invertors; melting; proximity effect; skin effect; electromagnetic induction; high-frequency applications; melting; parallel current-carrying conductors; power inverter; ratings; semiconductor fuselinks; skin and proximity effects;
fLanguage :
English
Journal_Title :
Electric Power Applications, IEE Proceedings B
Publisher :
iet
ISSN :
0143-7038
Type :
jour
DOI :
10.1049/ip-b.1982.0016
Filename :
4643480
Link To Document :
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