DocumentCode
903976
Title
Effect of operating conditions on reverse gate current of junction f.e.t.s
Author
Fowler, E.P.
Author_Institution
UKAEA, Winfrith, UK
Volume
4
Issue
11
fYear
1968
Firstpage
216
Lastpage
217
Abstract
With some types of nchannel junction f.e.t.s the measurement of gate leakage current under operating conditions (with a current flowing in the channel) has shown a very much higher value than would be expected from the maker´s specification of IGSS. The excess gate current which flows at higher channel voltage is proportional to the drain current and has a small negative temperature coefficient.
Keywords
transistors;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19680164
Filename
4233408
Link To Document