• DocumentCode
    903976
  • Title

    Effect of operating conditions on reverse gate current of junction f.e.t.s

  • Author

    Fowler, E.P.

  • Author_Institution
    UKAEA, Winfrith, UK
  • Volume
    4
  • Issue
    11
  • fYear
    1968
  • Firstpage
    216
  • Lastpage
    217
  • Abstract
    With some types of nchannel junction f.e.t.s the measurement of gate leakage current under operating conditions (with a current flowing in the channel) has shown a very much higher value than would be expected from the maker´s specification of IGSS. The excess gate current which flows at higher channel voltage is proportional to the drain current and has a small negative temperature coefficient.
  • Keywords
    transistors;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19680164
  • Filename
    4233408