Title :
RF Superconducting Properties of Thin Films on Niobium
Author :
Campisi, I.E. ; Deruyter, H. ; Farkas, Z.D. ; Garwin, E.L. ; Hogg, H.A. ; King, F. ; Kirby, R.E.
Author_Institution :
Stanford Linear Accelerator Center Stanford University, Stanford, California 94305
Abstract :
We are investigating the RF properties of thin films of materials which are known to have low secondary emission coefficients, such as NbC, NbN and TiN. Preliminary measurements on the latter material have been performed by depositing a 15 nm film on parts of a doubly re-entrant Nb cavity designed to favor electron multipacting which, in the uncoated cavity, occurs copiously between the posts´tips. The measurements performed with TiN films sputtered onto Nb indicate that the RF current losses are increased by the presence of the films while the dielectric losses are negligible, within the measurement sensitivity of the system. The electron multipacting cannot be excited between the posts coated with the material tested.
Keywords :
Current measurement; Dielectric loss measurement; Dielectric measurements; Electrons; Niobium; Performance evaluation; Radio frequency; Superconducting materials; Superconducting thin films; Tin;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1983.4336658