Title :
Outdoor Insulators Testing Using Artificial Neural Network-Based Near-Field Microwave Technique
Author :
Qaddoumi, Nasser N. ; El-hag, Ayman ; Saker, Yasser
Author_Institution :
Electr. Eng. Dept., American Univ. of Sharjah, Sharjah, United Arab Emirates
Abstract :
This paper presents a novel artificial neural network (ANN)-based near-field microwave nondestructive testing technique for defect detection and classification in nonceramic insulators (NCI). In this paper, distribution class 33-kV NCI samples with no defects, air voids in silicone rubber and fiber glass core, cracks in the fiberglass core, and small metallic inclusion between the fiber core and shank were inspected. The microwave inspection system uses an open-ended rectangular waveguide sensor operating in the near-field at a frequency of 24 GHz. A data acquisition system was used to record the measured data. ANN was trained to classify the different types of defects. The results showed that all defects were detected and classified correctly with high recognition rates.
Keywords :
cores; data acquisition; glass fibres; inclusions; inspection; insulator testing; learning (artificial intelligence); microwave detectors; neural nets; nondestructive testing; pattern classification; power engineering computing; rectangular waveguides; silicone rubber insulators; ANN; air void; artificial neural network-based near-field microwave technique; data acquisition system; defect classification; defect detection; distribution class NCI sample; fiber glass core crack; frequency 24 GHz; metallic inclusion; microwave inspection system; nonceramic insulator; nondestructive testing; open-ended rectangular waveguide sensor; outdoor insulator testing; shank inspection; silicone rubber; training; voltage 33 kV; Artificial neural networks; Feature extraction; Insulators; Materials; Microwave imaging; Microwave measurement; Microwave theory and techniques; Artificial neural network (ANN); near-field microwave imaging; outdoor insulators;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2013.2280486