• DocumentCode
    904250
  • Title

    Integrated injection logic: a new approach to LSI

  • Author

    Hart, Kees ; Slob, Arie

  • Volume
    7
  • Issue
    5
  • fYear
    1972
  • fDate
    10/1/1972 12:00:00 AM
  • Firstpage
    346
  • Lastpage
    351
  • Abstract
    Multicollector transistors fed by carrier injection are used. A simplified (five masks) standard bipolar process is used resulting in a packing density of 400 gates/mm/SUP 2/ with interconnection widths and spacings of 5 μm. The power-delay time product is 0.4 pJ per gate. An additional advantage is a very low supply voltage (less than 1 V). This, combined with the possibility of choosing the current level within several decades enables use in very low-power applications. With a normal seven-mask technology, analog circuitry has been combined with integrated injection logic (I/SUP 2/L).
  • Keywords
    Digital integrated circuits; Large scale integration; Logic circuits; Logic gates; digital integrated circuits; large scale integration; logic circuits; logic gates; Chip scale packaging; Circuit testing; Delay; Diodes; Electron devices; Fabrication; Immunity testing; Large scale integration; Logic circuits; Manufacturing;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1972.1052891
  • Filename
    1052891