• DocumentCode
    904343
  • Title

    A means of reducing custom LSI interconnection requirements

  • Author

    Calhoun, Donald F. ; McNamee, Lawrence P.

  • Volume
    7
  • Issue
    5
  • fYear
    1972
  • Firstpage
    395
  • Lastpage
    404
  • Abstract
    Large-scale integrated circuit interconnect approaches such as pad relocation and discretionary techniques have been developed for interconnecting very large numbers of circuits on monolithic integrated-circuit wafers. Although these approaches were perhaps premature in their original development, considerable interest is currently being shown in full wafer LSI. In order to avoid the defective circuits that naturally occur on such large circuit arrays, it has been necessary to customize each wafer´s interconnection mask to its unique yield pattern. The authors examine in detail a means of using each mask set for perhaps several unique wafers, thus providing important custom routing and mask generation cost savings. In the case of pad relocation, only a single mask then comprises the entire custom mask set for several wafer arrays.
  • Keywords
    Economics; Large scale integration; Masks; economics; large scale integration; masks; Aircraft; Circuit testing; Cities and towns; Costs; Electron devices; Integrated circuit interconnections; Integrated circuit yield; Large scale integration; Logic circuits; Standardization;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1972.1052899
  • Filename
    1052899