DocumentCode
904824
Title
Coupling Errors in Cavity-Resonance Measurements on MIC Dielectrics (Short Papers)
Author
Ladbrooke, P.H. ; Potok, M.H.N. ; England, E.H.
Volume
21
Issue
8
fYear
1973
fDate
8/1/1973 12:00:00 AM
Firstpage
560
Lastpage
562
Abstract
Measurements on MIC dielectrics have been made by applying the theory of resonant cavities to either wholly or partly metallized substrates. Two different schemes of coupling are employed, depending upon the metallization. Errors occur in the derived value of ε, due to the coupling, and are of opposite sense for the two methods discussed. They may be averaged to improve the overall measurement precision (0.5 percent).
Keywords
Acoustic transducers; Delay lines; Dielectric measurements; Microwave integrated circuits; Notice of Violation; Rayleigh scattering; Shape; Surface acoustic waves; Surface waves; VHF circuits;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.1973.1128061
Filename
1128061
Link To Document