Title :
Coupling Errors in Cavity-Resonance Measurements on MIC Dielectrics (Short Papers)
Author :
Ladbrooke, P.H. ; Potok, M.H.N. ; England, E.H.
fDate :
8/1/1973 12:00:00 AM
Abstract :
Measurements on MIC dielectrics have been made by applying the theory of resonant cavities to either wholly or partly metallized substrates. Two different schemes of coupling are employed, depending upon the metallization. Errors occur in the derived value of ε, due to the coupling, and are of opposite sense for the two methods discussed. They may be averaged to improve the overall measurement precision (0.5 percent).
Keywords :
Acoustic transducers; Delay lines; Dielectric measurements; Microwave integrated circuits; Notice of Violation; Rayleigh scattering; Shape; Surface acoustic waves; Surface waves; VHF circuits;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1973.1128061
